Biography

Nabil Bassim is a Professor in the Department of Materials Science and Engineering at McMaster University and the Scientific Director of the Canadian Centre for Electron Microscopy.

His research focuses on the development of novel electron microscopy, ion microscopy, and lithography techniques, including understanding the role of damage and doping in the manufacturing of novel nanostructured materials. He also serves as the Scientific Director of the CCEM, a CFI-funded National User Facility that is home to the most advanced, cutting edge analytical characterization tools in Canada. Besides studying ion-sample interactions, beam scanning strategies, machine learning-based optimization strategies, and material deposition for microscale additive processes, he also applies these techniques to a diverse set of materials, ranging from structural materials such as cement, concrete, and steel to nanomaterials and two-dimensional materials. He is the author of two major review articles on focused ion beam (FIB) and is the co-founder and co-organizer of the FIB-SEM User Meeting (www.fibsem.net), which is the largest FIB conference in North America. He also serves as the Faculty lead for McMaster Engineering’s Aerospace and Defense Initiative.