A ONE-DAY WORKSHOP on the use and theory of scanning electron microscopy (SEM) for various materials characterization applications. Speakers from Canada and the United States have been invited to present their work on the use of SEM, energy-dispersive X-ray spectroscopy, secondary electron imaging, backscattered electron imaging, transmission kikuchi diffraction, electron backscattered diffraction, SEM with electron energy loss spectroscopy, and computer simulations. The workshop will include the basic theory of SEM signal generation and applications on a broad range of materials such as mineral, metals, and Canadian artwork. For more information see the event flyer.